Test-retest reliability of the WAIS-R seven-subset short form
Arch Clin Neuropsychol (1998) 13 (1): 65.
01 February 1998
R.J. Shercliffe, G.L. Iverson, M. Guirguis; Test-retest reliability of the WAIS-R seven-subset short form. Arch Clin Neuropsychol 1998; 13 (1): 65. doi: 10.1093/arclin/13.1.65
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Long-term Stability and Reliability of Baseline Cognitive Assessments in High School Athletes Using ImPACT at 1-, 2-, and 3-year Test–Retest Intervals