Automating the Collection of Ultrathin Serial Sections for Large Volume TEM Reconstructions

Hayworth, KJ; Kasthuri, N; Schalek, R; Lichtman, JW

doi:10.1017/S1431927606066268

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Automating the Collection of Ultrathin Serial Sections for Large Volume TEM Reconstructions

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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

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Automating the Collection of Ultrathin Serial Sections for Large Volume TEM Reconstructions

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Automating the Collection of Ultrathin Serial Sections for Large Volume TEM Reconstructions

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